Loading patent…
AssigneeCanon Kabushiki Kaisha
InventorsSunao Ichihara, Natsuhiko Mizutani, Hideyuki Sugioka, Tetsuo Kobayashi, Kiyoshi Ishikawa, Shuji Taue
Estimating the term…
An atomic magnetometer includes a cell containing an atomic group, a pump light source, a probe light source, a mirror, and a detector. The cell is disposed between the pump light source and the mirror and between the probe light source and the detector. A pump beam emitted from the pump light source is circularly polarized light. The pump beam passes through the cell and is reflected by the mirror and then passes through the cell again. The probe beam emitted from the probe light source is linearly polarized light. An optical path of the probe beam is parallel to the plane of incidence of the pump beam and is also parallel to the surface of the mirror. The optical path of the probe beam crosses the optical path of the pump beam in the cell. The probe beam which has passed through the cell enters the detector.
An atomic magnetometer comprising:
An atomic magnetometer comprising:
A magnetic force measuring method comprising the steps of:
A magnetic force measuring method for measuring a rotation angle of a polarization plane of a probe beam by irradiating an atomic group contained in a hollow portion of a cell with a pump beam to uniformize directions of spin of atoms constituting the atomic group and then by irradiating the spin polarized atomic group of the atoms with linearly polarized light as the probe beam, said magnetic force measuring method comprising the steps of:
Dependencies are inferred from the claim text.