Real-time S-parameter imager
AssigneeThe University of Hong Kong
InventorsPranab Sabitru Naik, Christopher David Beling, Stevenson H. Y. Fung
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AssigneeThe University of Hong Kong
InventorsPranab Sabitru Naik, Christopher David Beling, Stevenson H. Y. Fung
Estimating the term…
An instrumentation setup is provided to process electronic signals in a positron imager functioning in two different modes of operations for scanning both bulk and thin film materials. According to one part of an implementation, an instrumentation setup comprises an XY-rastering stepper motor apparatus coupled with LVDTs (Linear Variable Differential Transformers), and nuclear signal processing and high speed data acquisition sections. Imaging of bulk material samples may be enabled by scanning a positron point source across a surface of samples. In another part of the irnplenientation, the instrumentation setup may comprise an electromagnetic deflection control arrangement in conjunction with a guided monoenergetic positron beam together with nuclear signal processing and data acquisition arrangements. This part of the implementation may scan and produce images for thin film samples. The instrumentation setup is capable of producing high quality real-time S-parameter images.
An instrumentation setup for processing imager electronic signals comprising:
Dependencies are inferred from the claim text.