Defective memory block identification in a memory device
AssigneeMicron Technology, Inc.
InventorFrankie F. Roohparvar
Life of this patent
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Abstract
During manufacture and testing of a memory device, a memory test is performed to determine which, if any, memory blocks are defective. A memory map of the defective blocks is stored in one of the defect-free memory blocks so that it can be read later by a controller during normal operation of the memory device. In one embodiment, the memory test is for a programmability test to determine if the memory block can be programmed. An indication of programmability is stored in each block in a predetermined location.
Claims16
A method for indicating a defect in a memory device having a memory array, the method comprising:
- determining if a defective memory block is in the memory array;
- and
- storing an indication of a location of a memory block determined to be defective in a memory block, in the memory array, determined to be defect free.
A method for indicating a defect in a memory device, the method comprising:
- determining if a memory block of the device has a defect;
- and
- if a memory block is determined to have a defect, storing an indication of the defect in the memory block determined to have the defect.
A method for indicating a defect in a memory device, the method comprising:
- determining whether a block of the memory device can be programmed;
- and
- if it is determined that the block can be programmed, storing a particular pattern at a location in the block, wherein the particular pattern is configured to indicate that the block can be programmed.
Dependencies are inferred from the claim text.