Data quality tracking
AssigneeAb Initio Technology LLC
InventorsDavid Wald, Tim Wakeling, Muhammad Arshad Khan
Life of this patent
Estimating the term…
Abstract
In general, a method includes determining metric values associated with data quality for one or more child nodes. Metric values are determined for a parent node based on the metric values of at least some of the child nodes, and relationships between one or more parent nodes and one or more child nodes define a hierarchy. The determination of the metric value for the parent node is repeated for multiple instances.
Claims25
A method including:
- determining metric values associated with data quality for one or more child nodes;
- determining a metric value for a parent node based on the metric values of at least some of the child nodes, wherein relationships between one or more parent nodes and one or more child nodes define a hierarchy;
- and
- repeating the determination of the metric value for the parent node for multiple instances of the determination, where, in at least two of the multiple instances, relationships between the parent node and the one or more child nodes used in determining the metric value for the parent node are the same in the at least two instances;
- wherein one or both of the metric values for the one or more child nodes or the metric value for the parent node is determined for each of the multiple instances and stored as a time series that represents the history of that metric value.
A computer-readable medium that stores executable instructions for use in obtaining a value from a device signal, the instructions for causing a computer to:
- determine metric values for one or more child nodes;
- determine a metric value for a parent node based on the metric values of at least some of the child nodes, wherein relationships between one or more parent nodes and one or more child nodes define a hierarchy;
- and
- repeat the determination of the metric value for the parent node for multiple instances of the determination, where, in at least two of the multiple instances, relationships between the parent node and the one or more child nodes used in determining the metric value for the parent node are the same in the at least two instances;
- wherein one or both of the metric values for the one or more child nodes or the metric value for the parent node is determined for each of the multiple instances and stored as a time series that represents the history of that metric value.
A system including:
- means for determining metric values for one or more child nodes;
- means for determining a metric value for a parent node based on the metric values of at least some of the child nodes, wherein relationships between one or more parent nodes and one or more child nodes define a hierarchy;
- and
- means for repeating the determination of the metric value for the parent node for multiple instances of the determination, where, in at least two of the multiple instances, relationships between the parent node and the one or more child nodes used in determining the metric value for the parent node are the same in the at least two instances;
- wherein one or both of the metric values for the one or more child nodes or the metric value for the parent node is determined for each of the multiple instances and stored as a time series that represents the history of that metric value.
Dependencies are inferred from the claim text.