Test system for adjusting a wireless communication device by impedance loading features
AssigneeWistron Neweb Corp.
InventorChen-Shu Peng
Life of this patent
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Abstract
A test system for adjusting a wireless communication device by impedance loading features includes a power supply for generating a plurality of voltages, a test fixture coupled to the power supply for generating impedances corresponding to a plurality of impedance loading areas, a test equipment coupled to a test point of the wireless communication device via the test fixture for measuring a plurality of radio frequency characteristic sets of the wireless communication device, and a decision device coupled to the test equipment for determining an optimal impedance loading area of the wireless communication device according to the plurality of radio-frequency characteristic sets.
Claims16
A test system for adjusting a wireless communication device by impedance loading features comprising:
- a power supply for generating a plurality of voltages;
- a test fixture coupled to the power supply for generating impedances corresponding to a plurality of impedance loading areas according to the plurality of voltages generated by the power supply;
- a test equipment coupled to a test point of the wireless communication device via the test fixture for measuring a plurality of radio frequency characteristic sets of the wireless communication device;
- and
- a decision device coupled to the test equipment for determining an optimal impedance loading area of the wireless communication device for adjusting the wireless communication device according to the plurality of radio frequency characteristic sets.
Dependencies are inferred from the claim text.