Nonvolatile memory device and program method with improved pass voltage window
AssigneeSamsung Electronics Co., Ltd.
InventorsKi-Tae Park, Yeong-Taek Lee, Soon-Wook Hwang, Young-Wook Jeong
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AssigneeSamsung Electronics Co., Ltd.
InventorsKi-Tae Park, Yeong-Taek Lee, Soon-Wook Hwang, Young-Wook Jeong
Estimating the term…
A flash memory and programming method are disclosed. The flash memory includes a memory cell array having memory cells arranged in a plurality of word lines including a selected word line and a plurality of non-selected word lines and a plurality of bit lines, a high voltage generator generating a program voltage applied to the selected word line, and a pass voltage applied to at least one of the non-selected word lines adjacent to the selected word line, and control logic controlling the generation of the program voltage, such that the program voltage is incrementally increased during a program operation, and generation of the pass voltage, such that the program voltage is incrementally increased.
A memory device, comprising:
A program method for a memory device including a memory cell array comprising a plurality of memory cells arranged in relation to a plurality of word lines including a selected word line and a plurality of non-selected word lines, and a plurality of bit lines, a high voltage generator configured to generate a program voltage applied to the selected word line, a pass voltage applied to at least one of the non-selected word lines adjacent to the selected word line, and a local voltage applied during to at least one of the non-selected word lines in a local self-boosting scheme, and control logic configured to control operation of the memory cell array and the high voltage generator, wherein the program method comprises:
A computational system comprising a central processing unit (CPU) and a memory controller connected via a system bus, the memory controller being connected to and controlling the operation of a memory device,
Dependencies are inferred from the claim text.