Phase change memory
AssigneeNanya Technology Corporation
InventorTe-Sheng Chao
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AssigneeNanya Technology Corporation
InventorTe-Sheng Chao
Estimating the term…
About 3 years 8 months of term left · ends 10 Jul 2030 (estimated)
A phase change memory with a primary memory array, a reference memory array, and a comparison circuit is provided. The electrical characteristic curve of the recording layers of the primary memory units is different from the electrical characteristic curve of the recording layers of the reference memory units. The primary memory array includes at least one primary memory unit to generate at least one sensing signal, wherein each of the primary memory units includes at least one recording layer can be programmed to a first resistance and a second resistance. The reference memory array includes at least one reference memory unit to generate at least one reference signal, wherein each of the reference memory units includes at least one recording layer can be programmed to change its resistance. The comparison circuit compares the sensing signal and the reference signal to generate a comparison result.
A phase change memory, comprising:
Dependencies are inferred from the claim text.
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1. Field of the Invention
The invention relates to the phase change memory, and more particularly to the reference memory unit of the phase change memory.
2. Description of the Related Art
The present invention can be more fully understood by reading the subsequent detailed description and examples with references made to the accompanying drawings, wherein:
FIG. 1 is a schematic diagram of a conventional memory array with a parallel-connected reference memory array announced by Ovonyx Inc. in 2001;
FIG. 2 is a block diagram of an embodiment of the phase change memory 200 of the invention;
The following description is of the contemplated mode of carrying out the invention. This description is made for the purpose of illustrating the general principles of the invention and should not be taken in a limiting sense. The scope of the invention is best determined by reference to the appended claims.
FIG. 2 is a block diagram of an embodiment of the phase change memory 200 of the invention. The phase change memory 200 comprises a primary memory block 220, a reference memory block 230 and a comparison circuit 240.
The primary memory block 220 comprises a plurality of primary memory units 221 arranged in at least one column and at least one row to form a memory array, such as the columns C1 to C4 and rows R1 to R4. The primary memory block 220 further comprises at least one column line and at least one row line, such as the column limes CL1 to CL 4 and row lines RL1 to RL4, respectively coupled to the corresponding primary memory units 221. Each of the primary memory units 221 comprises a transistor QM and a recording layer RML coupled to the transistor QM and a reference voltage VA. It is noted that the locations of the transistor QM and the recording layer RML can be interchangeable.
Auxiliary circuits: reading or sensing circuits or methods
Using resistive RAM [RRAM] elements: comprising amorphous/crystalline phase transition cells
Reading or sensing circuits or methods: read is performed on a reference element, e.g. cell, and the reference sensed value is used to compare the…
Nanostructure: dendrimer, i.e. serially branching or "tree-like" structure
From the US filing history. Foreign family members aren’t listed.