Amplitude-based approach for detection and classification of hard-disc defect regions
AssigneeLSI Corporation
InventorsShaohua Yang, George Mathew, Yang Han, Zongwang Li, Yuan Xing Lee
Life of this patent
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AssigneeLSI Corporation
InventorsShaohua Yang, George Mathew, Yang Han, Zongwang Li, Yuan Xing Lee
Estimating the term…
In a hard-disc drive, a defect region on the hard disc is classified as corresponding to either thermal asperity (TA) or media defect (MD) by generating two statistical measures. A first measure (e.g., α1) is based on (i) the magnitudes of one or both of signal values (e.g., equalizer input or output signal values) and the corresponding expected values of those signal values and (ii) the signs of one or both of the signal values and the expected signal values. A second measure (e.g., α2) is based on the magnitudes of one or both of the signal values and the expected signal values, but not the signs of either the signal values or the expected signal values. The two measures are then compared to determine whether the defect region corresponds to TA or MD.
A machine-implemented method for classifying a defect region on a hard disc as associated with either thermal asperity (TA) or media defect (MD), the method comprising:
A machine for classifying a defect region on a hard disc as associated with either thermal asperity (TA) or media defect (MD), the machine comprising:
A non-transitory machine-readable storage medium, having encoded thereon program code, wherein, when the program code is executed by a machine, the machine implements a method for classifying a defect region on a hard disc as associated with either thermal asperity (TA) or media defect (MD), the method comprising:
Dependencies are inferred from the claim text.