Inspection chip producing method and specimen detecting method

A method of producing an inspection chip comprising:

• a microstructure producing step of producing a microstructure where metallic portions having dimensions permitting excitation of localized plasmons are formed and distributed on one surface of a substrate;
• a specimen attaching step of attaching a specimen to surfaces of the metallic portions of the microstructure;
• and
• a metallic particle attaching step of attaching metallic particles having dimensions permitting excitation of surface plasmons to the specimen,
• wherein the steps are performed in the above-recited order, and
• wherein at least one of the following occurs:
• the specimen is attached to the metallic portions to which no substance capable of specifically binding to the specimen is secured in the specimen attaching step, and
• the metallic particles to which no substance capable of specifically binding to the specimen is secured are attached to the specimen in the metallic particle attaching step.

A method of producing an inspection chip comprising:

• a microstructure producing step of producing a microstructure where metallic portions having dimensions permitting excitation of localized plasmons are formed and distributed on one surface of a substrate;
• a specimen attaching step of attaching a specimen to surfaces of the metallic portions of the microstructure;
• and
• a metallic particle attaching step of attaching metallic particles having dimensions permitting excitation of surface plasmons to the specimen in this order,
• wherein the steps are performed in the above-recited order, and
• wherein the specimen is attached to the metallic portions to which no substance capable of specifically binding to the specimen is secured in the specimen attaching step, and the metallic particles to which no substance capable of specifically binding to the specimen is secured are attached to the specimen in the metallic particle attaching step.