Laminated film defect inspection method and laminated film defect inspection device
AssigneeNitto Denko Corporation
InventorsHiromichi Ohashi, Kosuke Sato
Life of this patent
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AssigneeNitto Denko Corporation
InventorsHiromichi Ohashi, Kosuke Sato
Estimating the term…
A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspecting presence of the defect in the film body in a vertical attitude while introducing the film body with the separator separated and removed therefrom to a film travel path directed in a vertical direction, and storing detection data; a separator laminating process and a protective film laminating process of laminating a separator and a protective film to a back surface and a front surface of the inspected film body, respectively; and a film collecting process of winding up the inspected laminated film laminated with the protective film and the separator are provided.
A method for inspecting a defect of a laminated film that inspects a detect of a wounded up laminated film, the method comprising:
A device for inspecting a defect of a laminated film that inspects a defect of a wounded up laminated film, the device comprising:
Dependencies are inferred from the claim text.