IDDQ testing
AssigneeInfineon Technologies AG
InventorDirk Hammerschmidt
Life of this patent
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Abstract
Embodiments of the invention relate to device-embedded IDDQ testing in the field to detect defects, aging, and other reliability reducing problems. Methods of testing integrated circuits and integrated circuit devices are disclosed. For example, an integrated circuit device can comprise an integrated circuit, a buffer capacitor coupled to the integrated circuit; and IDDQ test circuitry coupled to the buffer capacitor and configured to suspend normal operation of the integrated circuit and measure a discharge time of the buffer capacitor, wherein the discharge time is related to a leakage current of the integrated circuit.
Claims9
A method of testing an integrated circuit in the field comprising:
- forming a quiescent supply current (IDDQ) test circuit;
- coupling the IDDQ test circuit to a testable portion of the integrated circuit;
- scheduling the IDDQ test circuit to test the testable portion of the integrated circuit by selectively interrupting normal operation of the integrated circuit in the field;
- and
- testing the testable portion of the integrated circuit by the IDDQ test circuit after selectively interrupting normal operation of the integrated circuit in the field by turning off a clock of the testable portion of the integrated circuit, disconnecting the testable portion of the integrated circuit from a supply voltage, measuring a discharge time of a buffer capacitor, and comparing the discharge time of the buffer capacitor with a threshold that was determined from a measurement of the testable portion of the integrated circuit during manufacturing of the integrated circuit and stored individually for the integrated circuit.
Dependencies are inferred from the claim text.