Semiconductor device and method of fabricating the same
AssigneeKabushiki Kaisha Toshiba
InventorsTadayoshi Watanabe, Takamasa Usui
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AssigneeKabushiki Kaisha Toshiba
InventorsTadayoshi Watanabe, Takamasa Usui
Estimating the term…
A method of fabricating a semiconductor device includes forming an insulating film above a semiconductor substrate, forming a concave portion in the insulating film, forming a precursor film including a predetermined metallic element on a surface of the insulating film, carrying out a heat treatment on the precursor film and the insulating film to react with each other, thereby forming an insulative barrier film mainly comprising a compound of the predetermined metallic element and a constituent element of the insulating film in a self-aligned manner at a boundary surface between the precursor film and the insulating film, removing an unreacted part of the precursor film after forming the barrier film, forming a conductive film comprising at least one of Ru and Co on the barrier film, depositing a wiring material film on the conductive film, and forming a wiring from the wiring material film to provide a wiring structure.
A semiconductor device comprising:
Dependencies are inferred from the claim text.