Semiconductor device and method for manufacturing the same
AssigneeFujitsu Semiconductor Limited
InventorsYoichi Okita, Genichi Komuro
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AssigneeFujitsu Semiconductor Limited
InventorsYoichi Okita, Genichi Komuro
Estimating the term…
There is provided a semiconductor device including a silicon substrate, a source/drain region formed in a surface layer of the silicon substrate, a first insulating film provided with a first hole on the first source/drain region, a conductive film formed on an inner surface of the first hole, a filler body, which is formed with a thickness to fill the first hole on the first conductive film, forms a first conduct plug together with the conductive film, and is formed of an insulating material with an upper surface being amorphous, and a capacitor, which is formed on the first contact plug and is provided with a lower electrode electrically connected to the conductive film, a capacitor dielectric film formed of a ferroelectric material, and an upper electrode.
A semiconductor device comprising:
A method for manufacturing a semiconductor device, comprising:
A method for manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.