Semiconductor device manufacturing method and semiconductor device manufacturing apparatus
AssigneeUlvac, Inc.
InventorsMasanobu Hatanaka, Kanako Tsumagari, Michio Ishikawa
Life of this patent
Estimating the term…
Loading patent…
AssigneeUlvac, Inc.
InventorsMasanobu Hatanaka, Kanako Tsumagari, Michio Ishikawa
Estimating the term…
A method for manufacturing a semiconductor device that improves the reliability of a metal cap layer and productivity. The method includes an insulation layer step of superimposing an insulation layer (11) on a semiconductor substrate (2) including an element region (2b), a recess step of forming a recess (12) in the insulation layer (11), a metal layer step of embedding a metal layer (13) in the recess (12), a planarization step of planarizing a surface of the insulation layer (11) and a surface of the metal layer (13) to be substantially flush with each other, and a metal cap layer step of forming a metal cap layer (16) containing at least zirconium element and nitrogen element on the surface of the insulation layer (11) and the surface of the metal layer (13) after the planarization step.
A method for manufacturing a semiconductor device comprising steps of:
Dependencies are inferred from the claim text.