Method for manufacturing semiconductor chip and semiconductor device
AssigneeRenesas Electronics Corporation
InventorYoshitsugu Kawashima
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AssigneeRenesas Electronics Corporation
InventorYoshitsugu Kawashima
Estimating the term…
An improved yield of chips is realized by reducing the width of dicing streets on the front surface side of a semiconductor wafer. A method for semiconductor chip, divided a semiconductor wafer 10 having a plurality of circuit patterns formed on one surface 18 into pieces, comprising, forming a groove in a boundary region between the circuit patterns from the other surface 19 of the semiconductor wafer 10 by using a blade, forming a modified layer 14 in the boundary region between the circuit patterns by irradiation with laser light L from the one surface 18 or the other surface 19 of the semiconductor wafer 10, and dividing the semiconductor wafer into pieces by breaking the modified layer 14. The modified layer 14 is formed between a bottom surface 17 of a groove portion 16 and the one surface 18 of the semiconductor wafer 10, and a forming width WM of the modified layer 14 is smaller than the width of the groove portion 16.
A method for manufacturing a semiconductor chip by dividing a semiconductor wafer having a plurality of circuit patterns formed on one surface into pieces, said method comprising:
Dependencies are inferred from the claim text.