Method for forming a capped micro-electro-mechanical system (MEMS) device
AssigneeFreescale Semiconductor, Inc.
InventorsVeera M. Gunturu, Shivcharan V. Kamaraju, Lisa H. Karlin
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AssigneeFreescale Semiconductor, Inc.
InventorsVeera M. Gunturu, Shivcharan V. Kamaraju, Lisa H. Karlin
Estimating the term…
A capped micro-electro-mechanical systems (MEMS) device is formed using a device wafer and a cap wafer. The MEMS device is located on a frontside of the device wafer. A frontside of a cap wafer is attached to the frontside of the device wafer. A first stressor layer having a tensile stress is applied to a backside of the cap wafer after attaching the frontside of the cap wafer to the frontside of the device wafer. The first stressor layer and the cap wafer are patterned to form an opening through the first stressor layer and the cap wafer after applying the first stressor layer. A conductive layer is applied to the backside of the cap wafer, including through the opening to the frontside of the device wafer.
A method of making a capped micro-electro-mechanical systems device, comprise:
A method of forming a packaged micro-electro-mechanical systems (MEMS) device, wherein the MEMS device is located on a frontside of a device wafer, comprising:
A method of packaging a micro-electro-mechanical systems (MEMS) device, comprising:
Dependencies are inferred from the claim text.