Back to results
US 8,037,945 B2Granted
Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer
AssigneeSavannah River Nuclear Solutions, LLC
InventorsSamuel D. Fink, Fernando F. Fondeur
Life of this patent
Estimating the term…
Abstract
An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.
Claims19
An atomic force microscope, comprising:
- a micro thermal analyzer having a tip, wherein the micro thermal analyzer is configured for obtaining topographic data from a sample;
- an infrared light generator configured for directing an infrared beam onto a portion of the sample proximate to the tip of the micro thermal analyzer;
- and
- a Raman spectrometer configured for use in obtaining chemical data from the sampler;
- and, a fiber optic Fourier transform infrared (FTIR) spectrometer configured for use in obtaining chemical data from the sample.
2 more elements
An atomic force microscope, comprising:
- a micro thermal analyzer having a tip, wherein the micro thermal analyzer is configured for obtaining topographic data from a sample;
- an infrared light generator configured for directing an infrared beam onto a portion of the sample proximate to the tip of the micro thermal analyzer;
- a spectrometer configured for use in obtaining chemical data from the sample;
- and
- an enclosure surrounding the sample being measured and the tip of the micro thermal analyzer, wherein the enclosure is gas tight such that a gas is capable of being contained within the enclosure so as to allow the gas to be present at the tip of the micro thermal analyzer and at a portion of the sample being measured.
2 more elements
An atomic force microscope, comprising:
- a micro thermal analyzer that has a tip located at an end of a curved cantilever, wherein the curved cantilever carries a mirror, wherein the micro thermal analyzer has a laser and a photo diode array, wherein the laser is configured for directing a laser beam onto the mirror of the micro thermal analyzer such that a reflected laser beam from the mirror strikes the photo diode array so as to provide information relative to the location of the tip;
- a base onto which a sample for analysis is located;
- an infrared light generator configured for directing an infrared beam onto a portion of the sample proximate to the tip of the micro thermal analyzer;
- a fiber optic Fourier transform infrared (FTIR) spectrometer configured for sensing infrared light emitted by the sample upon application of the infrared beam, wherein the Fourier transform infrared (FTIR) spectrometer is configured for use in obtaining calorimetric data from the sample;
- a laser beam (785 nm) directed onto a portion of the sample surface proximate to the tip of the micro thermal analyzer;
- a Raman spectrometer configured for sensing a scattered beam from the sample for use in obtaining chemical data from the sample;
- and
- an enclosure surrounding the sample being measured and the tip of the micro thermal analyzer, wherein the enclosure is gas tight such that a gas is capable of being contained within the enclosure so as to allow the gas to be present at the tip of the micro thermal analyzer and at a portion of the sample being measured;
- wherein the atomic force microscope is capable of simultaneously obtaining topographic data of the sample, calorimetric data of the sample that includes enthalpy and heat capacity, and chemical data of the sample that includes molecular structure.
6 more elements
Dependencies are inferred from the claim text.