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US 8,028,213 B2Granted
Data transformation method and related device for a testing system
AssigneeNovatek Microelectronics Corp.
InventorsChih-Wei Tang, Chien-Yu Wei, Wei-Yi Wei, Jia-Jye Shyu
Life of this patent
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Abstract
A data transformation method for a testing system includes using a reception end for receiving a test signal comprising a test data and a timing information corresponding to the test data, and using a transformation unit for transforming the test data according to the timing information, so as to generate a test pattern utilized for testing a communication device.
Claims16
A data transformation method for a testing system comprising:
- using a reception end for receiving a test signal comprising a test data and a timing information corresponding to the test data;
- and
- using a transformation unit for transforming the test data according to the timing information, so as to generate a test pattern utilized for testing a communication device.
A data transformation device for a testing system comprising:
- a reception end for receiving a test signal comprising a test data and a timing information corresponding to the test data;
- and
- a transformation unit coupled to the reception end for transforming the test data according to the timing information, so as to generate a test pattern utilized for testing a communication device.
A testing system for testing a communication device comprising:
- a reception unit installed in the communication device for receiving a plurality of test patterns;
- a transmission unit for outputting the plurality of test patterns;
- a serial transmission interface coupled between the reception unit and the transmission unit for transmitting the plurality of test patterns;
- a data processing device for generating a plurality of test signals each comprising a test data and a timing information corresponding to the test data;
- and
- a data transformation unit coupled between the data processing device and the transmission unit for transforming the plurality of test signals according to the timing information corresponding to the plurality of test signals, so as to generate the plurality of test patterns.
3 more elements
Dependencies are inferred from the claim text.