Devices, methods, and apparatuses for detection, sensing, and reporting functionality for semiconductor memory
AssigneeMicron Technology, Inc.
InventorDavid R. Resnick
Life of this patent
Estimating the term…
Abstract
Methods, apparatuses and systems are disclosed for a memory device. In one embodiment, a memory device is disclosed that may include a command error module operably coupled to a mode register, a command input, and an address input. The command error module may be configured to detect an invalid command sequence and report an error indication to an output signal. Additionally, the memory device may include a temperature sensor operably coupled to a mode register and a reference voltage. The temperature sensor may be configured to sense a device temperature and report a temperature status. Furthermore, the memory device may be incorporated into a memory module, which may be included in an electronic system.
Claims32
A method of modifying operation of a memory, comprising:
- enabling a temperature sensor of a memory device with a mode register of the memory device;
- sensing a temperature with the temperature sensor;
- requesting an output from the temperature sensor with the mode register;
- receiving a command at a command error module of the memory device;
- detecting a clock cycle;
- identifying the command as a temporally invalid command;
- and
- reporting to a memory interface at least one of a temperature status associated with the sensed temperature and an error indication associated with the temporally invalid command.
A method of reporting a command error within a memory, comprising:
- receiving a command at a command error module of a memory device;
- detecting a clock cycle;
- identifying the command as a temporally invalid command;
- and
- reporting an error indication to a memory interface.
A memory device, comprising:
- a command error module of the memory device operably coupled to at least one of a command signal and an address signal and configured to:
- receive a command for the memory device;
- detect a clock cycle;
- identify the command as a temporally invalid command;
- report an error indication to a memory interface;
- and
- detect a parity error on the command signal, the address signal, or combinations thereof;
- and
- at least one output signal operably coupled to the command error module and configured to output an error indication.
A memory module, comprising:
- a memory interface;
- and
- at least one memory device comprising:
- a command error module operably coupled to a command signal and an address signal and configured to detect and report a temporally invalid command sequence;
- and
- at least one output signal operably coupled to the command error module and configured to output an error indication;
- and
- a mode register of the at least one memory device configured to enable a temperature sensor of the at least one memory device, each memory device of the at least one memory device operably coupled to the memory interface and configured to report a temperature status and the error indication to the memory interface, wherein the memory interface is configured to modify at least one operation parameter of the memory device in response to the temperature status.
An electronic system, comprising:
- at least one processor;
- and
- at least one memory module, including at least one memory device comprising:
- a command error module operably coupled to a command signal and an address signal and configured to detect and report a temporally invalid command sequence;
- and
- at least one output signal operably coupled to the command error module and configured to output an error indication;
- wherein the at least one memory module comprises at least one of a dual in-line memory module (DIMM), single in-line memory module (SIMM), RAMBUS® in-line memory module (RIMM) and Triple in-line memory module (TRIMM).
Dependencies are inferred from the claim text.