Multi drive test system for data storage device

A data storage device manufacture method comprising:

• assembling a plurality of data storage devices;
• connecting the assembled data storage devices to a tester,
• wherein the tester comprises two Integrated Device Electronics (IDE) adapter cards that each have a Field Programmable Gate Array (FPGA), wherein each of the plural data storage devices is connected to the tester by a separate bus provided by the FPGA of one of the two IDE adapter cards, and wherein none of the plural data storage devices operate as a master or as a slave;
• and
• executing an operation test, comprising a first portion and a second portion, on each of the assembled data storage devices;
• wherein, in the first portion of the operation test, during a waiting period when exchange is paused between the tester and a data storage device of which operation test is being executed, the tester executes the operation test of another one of the plural storage devices,
• wherein, in the first portion of the operation test, when the waiting period of the paused exchange between the tester and said data storage device expires, the tester pauses the operation test of said other one of the plural storage devices to resume the operation test of said storage device, and
• wherein, in the second portion of the operation test, in response to a determination that a speed performance test is to be performed on the data storage device, the tester halts the testing of all other of the plural storage devices so that a central processing unit (CPU) of the tester may be dedicated to performing the speed performance test on the data storage device.