Apparatus and method for testing a panel of interferometric modulators

An apparatus for testing a panel comprising a plurality of interferometric modulators, comprising:

• means for applying a ramped voltage waveform to the plurality of interferometric modulators of the panel;
• and
• means for, in response to applying the ramped voltage, identifying a first voltage at which a first threshold number of the plurality of interferometric modulators of the panel enter a stiction state, wherein with respect to an interferometric modulator that enters the stiction state, a first portion of the interferometric modulator adheres to a second portion of the interferometric modulator.

A non-transitory computer-readable medium having stored thereon instructions, comprising:

• instructions that, when executed by a computer, cause the computer to apply a ramped voltage waveform to a plurality of interferometric modulators of a panel;
• and
• instructions that, when executed by the computer, cause the computer to in response to applying the ramped voltage, identify a first voltage at which a first threshold number of the plurality of interferometric modulators of the panel enter a stiction state, wherein with respect to an interferometric modulator that enters the stiction state, a first portion of the interferometric modulator adheres to a second portion of the interferometric modulator.