Method for calculating height of chuck top and program storage medium for storing same method
AssigneeTokyo Electron Limited
InventorsKazunari Ishii, Masaru Suzuki
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorsKazunari Ishii, Masaru Suzuki
Estimating the term…
A method is for calculating a height of a chuck top. A height of the top surface of the chuck top which corresponds to an arbitrary position specified on the XY coordinate plane by a computer is calculated in each of the four quadrants based on a coordinate transformation formulas. The method includes setting, by using the computer, a conical model in which two adjacent points other than the center point of the chuck top which correspond to the specified coordinates in a predetermined quadrant of the XY coordinate plane are obtained on a circumference having the center point of the chuck top as the origin and specifying an arbitrary point in the predetermined quadrant by using the computer and calculating a height of the arbitrary point of the chuck top based on the conical model, the coordinate transformation formulas and the specified coordinates.
A method for calculating a height of a chuck top, wherein when electrical characteristics of a target object mounted on the chuck top of a probe device are inspected, XY coordinates of at least five points including a center point of a top surface of the chuck top and right, left, upper and lower points thereof are specified by a computer on an XY coordinate plane on the computer;
A method for calculating a height of a chuck top, wherein when electrical characteristics of a target object mounted on the chuck top of a probe device are inspected, XY coordinates of at least five points including a center point of a top surface of the chuck top and right, left, upper and lower points thereof are specified by a computer on an XY coordinate plane on the computer;
A storage medium storing as a program a method for calculating a height of a chuck top, wherein when electrical characteristics of a target object mounted on the chuck top of a probe device are inspected, XY coordinates of at least five points including a center point of a top surface of the chuck top and right, left, upper and lower points thereof are specified by a computer on an XY coordinate plane on the computer;
A storage medium storing as a program a method for calculating a height of a chuck top, wherein when electrical characteristics of a target object mounted on the chuck top of a probe device are inspected, XY coordinates of at least five points including a center point of a top surface of the chuck top and right, left, upper and lower points thereof are specified by a computer on an XY coordinate plane on the computer;
Dependencies are inferred from the claim text.