Mechanism for measuring read current variability of SRAM cells
AssigneeApple Inc.
InventorsAshish R. Jain, Priya Ananthanarayanan, Greg M. Hess, Edgardo F. Klass
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AssigneeApple Inc.
InventorsAshish R. Jain, Priya Ananthanarayanan, Greg M. Hess, Edgardo F. Klass
Estimating the term…
A mechanism for measuring the variability of the read current of SRAM cells on an integrated circuit includes the integrated circuit having an SRAM array including a plurality of SRAM cells. The integrated circuit may also include a selection circuit configured to select a particular SRAM cell in response to a selection input. An oscillator circuit such as a ring oscillator, for example, on the integrated circuit may be configured to oscillate at a frequency that is dependent upon a read current of a selected SRAM cell during operation in a first mode. A frequency determining circuit that is coupled to the oscillator circuit may be configured to output a value corresponding to the frequency of oscillation of the oscillator circuit.
An integrated circuit comprising:
An integrated circuit comprising:
A method comprising:
Dependencies are inferred from the claim text.