US 8,027,030 B2 · Method and system for standardizing microscope instruments

Abstract

Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Claims6

Dependent claims

A calibration instrument for sampling illumination of an excitation light source of a microscopy system, comprising:

a calibration surface positioned along an optical path to substantially uniformly scatter illumination from the excitation light source toward a detection portion of the microscopy system;
a dichromatic mirror positioned to reflect illumination from the excitation light source along an optical path through an objective toward a target sample and to transmit at least a portion of illumination from the target sample toward a detection portion of the microscopy system, wherein the calibration surface temporarily blocks the optical path between the dichromatic mirror and the objective during calibration and scatters a substantial portion of the reflected excitation light through the dichromatic mirror toward the detector;
and
a housing configured to retain the dichromatic mirror and the calibration surface in a fixed relation with respect to each other, wherein the housing is adapted for placement within an interchangeable filter selection mechanism.

1 more element

Dependencies are inferred from the claim text.

Method and system for standardizing microscope instruments

Life of this patent

Method and system for standardizing microscope instruments

Life of this patent

Abstract

Claims6