US 8,026,734 B2Granted

Dual tip test probe assembly

AssigneeSV Probe Pte. Ltd.

InventorsSon Ngoc Dang, John McCormick, Habib Kilicaslan

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Abstract

A dual tip test probe assembly for use in both cantilever and vertical probe applications includes first and second elongated test probes, each having a body portion and a tip portion with a tip configured to make contact with a device under test. An electrically-insulating material is disposed between but not in contact with the body portions of the first and second elongated test probes to electrically isolate the first and second elongated test probes. The first and second elongated test probes are held in alignment with respect to each other so that the tip of the first elongated test probe is adjacent to and not in contact with the tip of the second elongated test probe for making simultaneous contact with the device under test. The dual tip test probe assembly provides a low inductance and a small, stable footprint for testing small and/or non-flat test points.

Claims15

Dependent claims

A test probe assembly comprising:

a first elongated test probe having at least a curved body portion and a tip portion with a tip configured to make contact with a device under test;
a second elongated test probe having at least a curved body portion and a tip portion with a tip configured to make contact with the device under test;
and
an electrically-insulating material disposed between and in contact with the curved body portion of the first elongated test probe and the curved body portion of the second elongated test probe to electrically insulate the first elongated test probe from the second elongated test probe,
wherein the first elongated test probe and the second elongated test probe are held in alignment with respect to each other so that the curved body portion of the first elongated test probe is aligned in the same direction as the curved body portion of the second elongated test probe and so that the tip of the first elongated test probe is adjacent to but not in contact with the tip of the second elongated test probe for making simultaneous contact with the device under test.

2 more elements

Dependencies are inferred from the claim text.