Fault testing for interconnections
AssigneeSilicon Image, Inc.
InventorsChinsong Sul, Gijung Ahn
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AssigneeSilicon Image, Inc.
InventorsChinsong Sul, Gijung Ahn
Estimating the term…
Embodiments of the invention are generally directed to fault testing for interconnections. An embodiment of a fault analysis apparatus includes a test pattern source to provide a test pattern for an interconnection between a transmitter and a receiver, the interconnection having a transmitter end and a receiver end, the interconnection including a first wire and a second wire, the transmitter transmitting the test pattern on the first wire to the receiver. The apparatus further includes a first switch to open and close a first connection for the first wire, and a second switch to open and close a second connection for the second wire. The first switch and the second switch are to be set according to a configuration to set at least a portion of a test path for the detection of one or more faults in the interconnection.
A fault analysis apparatus comprising:
A method comprising:
A fault analysis system comprising:
A computer-readable medium having stored thereon data representing sequences of instructions that, when executed by a processor, cause the processor to perform operations comprising:
Dependencies are inferred from the claim text.