Projection lamp test device
AssigneeSeiko Epson Corporation
InventorsDavid Koll, Tom Else
Life of this patent
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Abstract
A projector lamp electronic test circuit is provided. The test circuit includes an electrical connector configured to be operatively coupled to a lamp of a projection unit under test, a converter configured to receive a test charge to be sent to the lamp from an alternating current power source, the converter configured to convert the test charge from alternating current to direct current, and an autotransformer operatively coupled to the converter, the autotransformer configured to regulate a voltage of the test charge, the voltage being suitably high enough to cause failure of the lamp.
Claims20
A projector lamp electronic test circuit, comprising:
- An electrical connector configured to be operatively coupled to a lamp of a projection unit under test;
- a converter configured to receive a test charge to be sent to the lamp from an alternating current power source, the converter configured to convert the test charge from alternating current to direct current;
- and
- an autotransformer operatively coupled to the converter, the autotransformer configured to regulate a voltage of the test charge, the voltage being suitably high enough to cause failure of the lamp.
A projector lamp particle containment test system, comprising:
- a housing to contain a projection unit under test;
- an electrical connector configured to be operatively coupled to a lamp of the projection unit under test;
- a converter configured to receive a test charge to be sent to the lamp from an alternating current power source, the converter configured to convert the test charge from alternating current to direct current;
- and
- an autotransformer operatively coupled to the converter, the autotransformer configured to regulate a voltage of the test charge based on input from a user input device operatively coupled to the autotransformer, the user input device being configured to adjust the voltage of the test charge to a voltage suitably high enough to cause failure of the lamp.
A method for failure testing a lamp of a projection unit under test, comprising:
- placing a projection unit under test having a lamp in a projector lamp particle containment test device;
- connecting the lamp of the projection unit under test to an electrical connector of an electronic test circuit of the projector lamp particle containment test device, the electronic test circuit configured to generate a test charge to be sent to the lamp via the electrical connector;
- providing input that adjusts a state of an autotransformer of the electronic test circuit to regulate a voltage of the test charge at a voltage suitably high enough to cause failure of the lamp;
- and
- adjusting a state of a fire switch of the electronic test circuit to send the test charge to the lamp.
Dependencies are inferred from the claim text.