Die imprint by double side force-balanced press for step-and-repeat imprint lithography
AssigneeNanonex Corporation
InventorsWei Zhang, Hua Tan, Lin Hu, Stephen Y. Chou
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AssigneeNanonex Corporation
InventorsWei Zhang, Hua Tan, Lin Hu, Stephen Y. Chou
Estimating the term…
In accordance with the invention, step-and-repeat imprint lithography is effected by applying balanced pressing forces from both sides of a substrate. The pressing forces are substantially equal in amplitude and opposite in direction. With the pressing forces thus balanced, the fixture that steps and holds the substrate does not bear the load of imprinting. The balance allows use of a high resolution aligning stage to carry the substrate and to maintain high accuracy of positioning without being shifted by change of load. With this method, sufficient imprint pressure can be used to obtain high quality patterning, a thin and uniform residual layer, and a high fidelity pattern.
A method of imprint lithography to provide step-and-repeat imprint replication on a moldable surface of a substrate of a pattern having microscale or nanoscale features comprising the steps of:
Dependencies are inferred from the claim text.