Comparator circuitry connected to input and output of tristate buffer
AssigneeTexas Instruments Incorporated
InventorLee D. Whetsel
Life of this patent
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Abstract
A test controller applies test stimulus signals to the input pads of plural die on a wafer in parallel. The test controller also applies encoded test response signals to the output pads of the plural die in parallel. The encoded test response signals are decoded on the die and compared to core test response signals produced from applying the test stimulus signals to core circuits on the die. The comparison produces pass/fail signals that are loaded in to scan cells of an IEEE 1149.1 scan path. The pass/fail signals then may be scanned out of the die to determine the results of the test.
Claims3
An integrated circuit comprising:
- A. input pads;
- B. output pads;
- C. core circuitry coupled between the input pads and the output pads, the core circuitry having an output lead, and an output control lead;
- D. a tri-state buffer having an input lead connected to the output lead of the core circuitry, a data output lead connected to an output pad, and an enable input lead carrying an enable signal that can place the data output lead of the tri-state buffer in a high impedance state;
- E. comparator circuitry having an input lead connected to the output lead of the core circuitry, a control input lead connected to the output control lead, an encoded response input lead connected to the output pad and the data output lead of the tri-state buffer, and an enable input lead;
- and
- F. a logic gate having an input connected to the output control lead, another input connected to the enable input lead of the comparator circuitry, and an output connected to the enable input lead of the tri-state buffer.
Dependencies are inferred from the claim text.