Reflective processing of TMK hierarchies
AssigneeDiscovery Machine, Inc.
InventorsTodd William Griffith, Robert Douglas Ross, Brian Joseph Rogosky, Jason Randolph Potts
Life of this patent
Estimating the term…
Loading patent…
AssigneeDiscovery Machine, Inc.
InventorsTodd William Griffith, Robert Douglas Ross, Brian Joseph Rogosky, Jason Randolph Potts
Estimating the term…
A method for the automatic examination of knowledge system hierarchies is disclosed. A target TMK hierarchy is represented as a plurality of records in a database. A second TMK hierarchy (a “critic”) is constructed of tasks, subtasks, methods, procedures and actions. The critic hierarchy includes actions that retrieve and examine at least one record of the database representing the target hierarchy. The examination of the record provides a result. The result is of the form of a modification of the processing within the critic hierarchy or of the form of a report or a modification of the target hierarchy's elements, namely, tasks, methods, procedures, actions, class structures, or the relationship between the elements.
A method for examining a first task-method-knowledge (“TMK”) hierarchy, comprising:
A computer program embodied on a non-transitory computer readable medium, that when executed by a computer processor, is configured to control a method for examining a first task-method-knowledge (“TMK”) hierarchy, wherein control of the method comprises:
A method for examining a first task-method-knowledge (“TMK”) hierarchy for errors, comprising:
Dependencies are inferred from the claim text.