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US 8,014,214 B2Granted
Semiconductor memory device
AssigneeHynix Semiconductor Inc.
InventorKhil-Ohk Kang
Life of this patent
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Abstract
A semiconductor memory device is provided which includes a voltage detecting unit configured to compare a target voltage level with a fed-back internal voltage to output a detection signal in a normal mode, a driving unit configured to selectively drive an internal voltage terminal to a first or second power supply voltage according to an operation mode in response to the detection signal, and an enable control unit configured to control the driving unit in response to a control signal corresponding to the operation mode.
Claims12
A semiconductor memory device, comprising:
- a voltage detecting unit configured to compare a target voltage level with a fed-back internal voltage to output a detection signal in a normal mode;
- a driving unit configured to selectively drive an internal voltage terminal with a first or second power supply voltage in response to the detection signal and in response to indication as to the normal mode or a test mode;
- and
- an enable control unit configured to control the driving unit in response to a control signal in the test mode and to be disabled in the normal mode.
1 more element
A semiconductor memory device, comprising:
- a voltage detecting unit configured to compare a reference voltage with a fed-back internal voltage to output a detection signal in response to an enable signal;
- a normal driving unit configured to drive an internal voltage terminal using a first power supply voltage in response to the detection signal;
- and
- a test mode driving unit configured to receive a second power supply voltage higher than the first power supply voltage and to output a first test voltage corresponding to the second power supply voltage or a around voltage to the internal voltage terminal in response to a first control signal and a second control signal.
1 more element
Dependencies are inferred from the claim text.