Particle state and flux sensor
AssigneeCyber Materials LLC
InventorsBrian Louis Vattiat, Donald Edward Wroblewsky, Michael Alan Gevelber
Life of this patent
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AssigneeCyber Materials LLC
InventorsBrian Louis Vattiat, Donald Edward Wroblewsky, Michael Alan Gevelber
Estimating the term…
A method of measuring parameters of a particle includes providing a particle, wherein the particle has a first portion and a second portion. The process includes providing a column of photo-detectors including a first photo-detector and a second photo-detector, wherein the first photo-detector and the second photo-detector are sensitive to the same range of light frequencies. Light is projected from the particle onto the column of photo-detectors wherein the column of photo-detectors is oriented so the light from the first portion is projected onto the first photo-detector and light from the second portion is projected onto the second photo-detector. Light measured by the first photo-detector differs from light measured by the second photo-detector. The process further includes using the different first and the second photo-detector measurements to determine at least one from the group consisting of particle temperature and particle diameter.
A method of measuring parameters of a particle comprising:
A method of measuring parameters of a particle comprising:
A method of measuring parameters of a particle comprising:
Dependencies are inferred from the claim text.