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US 8,013,593 B2Granted
Voltage measuring apparatus for semiconductor integrated circuit and voltage measuring system having the same
AssigneeHynix Semiconductor Inc.
InventorsHyung-Soo Kim, Yong-Ju Kim, Jong-Woon Kim, Hee-Woong Song, Ic-Su Oh, Tae-Jin Hwang
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Abstract
A voltage measuring apparatus for a semiconductor integrated circuit includes a first delay unit configured to delay a reference clock in a first region, a second delay unit configured to delay the reference clock in a second region and an analysis unit configured to analyze a difference in voltage level between the regions based on the phases of associated with the delayed clock signals generated by the first and second delay units.
Claims8
A voltage measuring system comprising:
- a power supply apparatus configured to supply an external power source voltage to a semiconductor integrated circuit;
- and
- a mother board on which the semiconductor integrated circuit is disposed,
- wherein the semiconductor integrated circuit configured to have:
- a plurality of noise regions, in which external power is differently affected by, noise;
- delay units to delay a reference clock signal in the individual noise, regions;
- and
- an analysis unit to discriminate a difference in phase between the delayed clock signals.
5 more elements
Dependencies are inferred from the claim text.