Semiconductor device

Abstract

A device includes a measurement target circuit including a first circuit, a switch provided to a measurement node of the first circuit and a second circuit connected to the measurement node of the first circuit through the switch; and a current measuring circuit including a reference current source group connected to the measurement node through the switch and making a reference current of a predetermined value flow into the first circuit, a sample hold circuit connected to the measurement node, and sampling and holding the potential of the measurement node when the first circuit is connected to the second circuit by the switch, and a comparator connected to the measurement node and an output of the sample hold circuit and comparing an output of the sample hold circuit with the potential of the measurement node when the first circuit is connected to the reference current source group by the switch.

Dependencies are inferred from the claim text.