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US 8,013,579 B2Granted
Voltage trimming
AssigneeMicron Technology, Inc.
InventorToru Tanzawa
Life of this patent
Estimating the term…
Abstract
Embodiments are provided that include a memory die, memory devices, and methods, such as those comprising a voltage generator, including an output voltage and an adjustment circuit configured to cause adjustment of the output voltage based on a latch signal. Further one such method includes applying an input voltage to an input of a voltage generator, adjusting the input voltage to an adjusted voltage, comparing the adjusted voltage to a reference voltage, generating trim data based on the comparison and storing the trim data.
Claims17
A memory device, comprising:
- a voltage detector circuit configured to receive a test voltage, a reference voltage, and a trimming signal, and configured to output a latch signal, wherein the test voltage is adjusted to an adjusted voltage based on the trimming signal and the latch signal is based on a comparison of the reference voltage and the adjusted voltage;
- a voltage source configured to output a source voltage that is received by the voltage detector;
- a switch coupled between the voltage source and the voltage detector circuit, wherein the switch is configured to disconnect the input voltage from the voltage detector circuit;
- and
- a trimming circuit configured to output the trimming signal based on a trim value and to set the trim value based on the latch signal.
2 more elements
A method, comprising:
- applying a test voltage to an input of a voltage generator;
- adjusting the test voltage to an adjusted voltage via one or more of a first feedback signal transmitted from a voltage detector circuit to a trimming circuit and a second feedback signal transmitted from the voltage detector circuit to an oscillator of the voltage generator;
- comparing the adjusted voltage to a reference voltage;
- generating trim data based on the comparison;
- storing the trim data;
- and
- closing a feedback loop in the voltage generator to disconnect the test voltage from the output path based on the comparison.
4 more elements
Dependencies are inferred from the claim text.