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US 8,013,392 B2Granted
High mobility CMOS circuits
AssigneeInternational Business Machines Corporation
InventorsBruce B. Doris, Oleg G. Gluschenkov, Huilong Zhu
Life of this patent
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Abstract
Semiconductor structure formed on a substrate and process of forming the semiconductor. The semiconductor includes a plurality of field effect transistors having a first portion of field effect transistors (FETS) and a second portion of field effect transistors. A first stress layer has a first thickness and is configured to impart a first determined stress to the first portion of the plurality of field effect transistors. A second stress layer has a second thickness and is configured to impart a second determined stress to the second portion of the plurality of field effect transistors.
Claims18
A semiconductor circuit comprising a substrate;
- a plurality of field effect transistors comprising pFETS and nFETS formed on the substrate, the plurality of field effect transistors including a first portion of field effect transistors and a second portion of field effect transistors;
- a first stress layer having a first thickness and being configured to impart a first determined stress to the first portion of the plurality of field effect transistors;
- and
- a second stress layer having a second thickness and being configured to impart a second determined stress to the second portion of the plurality of field effect transistors,
- wherein the first thickness is different than the second thickness,
- wherein the first determined stress is different than the second determined stress,
- wherein:
- the first portion of the plurality of field effect transistors have spacings between adjacent field effect transistors that fall within a first defined spacing range;
- and
- the second portion of the plurality of field effect transistors have spacings between adjacent field effect transistors that fall within a second defined spacing range,
- wherein the first defined spacing range is different than the second defined spacing range, and
- wherein at least one of:
- the first stress layer is applied over an entire surface containing the plurality of field effect transistors;
- the first stress layer imparts the first determined stress to a channel region of the first portion of the plurality of field effect transistors;
- and
- the first stress layer is formed on top of the first portion of the plurality of field effect transistors and the second stress layer is formed on top of the second portion of the plurality of field effect transistors.
13 more elements
A semiconductor circuit comprising a substrate;
- a plurality of field effect transistors comprising pFETS and nFETS formed on the substrate, the plurality of field effect transistors including a first portion of field effect transistors and a second portion of field effect transistors;
- the first portion of field effect transistors having a different spacing density than the second portion of field effect transistors;
- a first stress layer having a first thickness and being configured to impart a first determined stress to the first portion of the plurality of field effect transistors;
- and
- a second stress layer having a second thickness and being configured to impart a second determined stress to the second portion of the plurality of field effect transistors,
- wherein the first thickness is different than the second thickness,
- wherein the first determined stress is different than the second determined stress, and
- wherein at least one of:
- the first stress layer is applied over an entire surface containing the plurality of field effect transistors;
- the first stress layer imparts the first determined stress to a channel region of the first portion of the plurality of field effect transistors;
- and
- the first stress layer is formed on top of the first portion of the plurality of field effect transistors and the second stress layer is formed on top of the second portion of the plurality of field effect transistors.
9 more elements
A semiconductor circuit comprising a substrate;
- a first group of transistors comprising:
- nFETs interspersed with pFETs spaced a first spacing density, or pFETs interspersed with nFETs spaced the first spacing density;
- a first stress layer having a first thickness and being configured to impart stresses to the first group of transistors;
- a second group of transistors comprising:
- nFETs interspersed with pFETs spaced a second spacing density, or pFETs interspersed with nFETs spaced the second spacing density;
- and
- a second stress layer having a second thickness and being configured to impart stresses to the second group of transistors,
- wherein:
- the first spacing density is different than the second spacing density;
- and
- the first thickness is different than the second thickness.
8 more elements
Dependencies are inferred from the claim text.