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US 8,013,323 B2Granted
Nitride semiconductor and method for manufacturing thereof
AssigneeLG Innotek Co., Ltd.
InventorSung Chul Choi
Life of this patent
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Abstract
A P-type nitride semiconductor and a method for manufacturing the same are provided. A nitride semiconductor includes a P-type nitride layer formed on a active layer, wherein the P-type nitride layer is a P-type nitride layer with the group 4 element doped.
Claims12
A nitride semiconductor, comprising:
- a P-type nitride layer formed on an active layer,
- wherein the P-type nitride layer comprises a group 4 element,
- wherein the group 4 element is not substantially combined with hydrogen (H),
- wherein the group 4 element is an element selected from the group consisting of silicon (Si), carbon (C), and germanium (Ge), and
- wherein the group 4 element is at least partially doped at one or more nitrogen vacancies of the P-type nitride layer.
2 more elements
A nitride semiconductor, comprising:
- a buffer layer formed on a substrate;
- an under layer formed on the buffer layer;
- an active layer formed on the under layer for emitting light;
- a P-type nitride layer comprising a group 4 element on the active layer,
- wherein the group 4 element is not substantially combined with hydrogen (H),
- wherein the group 4 element is an element selected from the group consisting of silicon (Si), carbon (C), and germanium (Ge), and
- wherein the group 4 element is at least partially doped at one or more nitrogen vacancies of the P-type nitride layer.
4 more elements
A nitride semiconductor, comprising:
- a conductive substrate;
- a N-type semiconductor layer on the conductive substrate;
- an active layer on the N type semiconductor layer;
- and
- a P-type semiconductor layer on the active layer,
- wherein the P-type semiconductor layer comprises at least one group 4 element,
- wherein the group 4 element is not substantially combined with hydrogen (H),
- wherein the group 4 element is an element selected from the group consisting of silicon (Si), carbon (C), and germanium (Ge), and
- wherein the group 4 element is at least partially doped at one or more nitrogen vacancies of the P-type semiconductor layer.
6 more elements
Dependencies are inferred from the claim text.