Surface inspecting method and device
AssigneeTopcon Corporation
InventorsHisashi Isozaki, Takehiro Takase, Takashi Kakinuma, Hiroyuki Maekawa, Fumio Koda, Michihiro Yamazaki
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AssigneeTopcon Corporation
InventorsHisashi Isozaki, Takehiro Takase, Takashi Kakinuma, Hiroyuki Maekawa, Fumio Koda, Michihiro Yamazaki
Estimating the term…
A light source section outputs optical flux having two types of wavelength, which are a short wavelength and a long wavelength, while the intensity is made variable. The output from the first light intensity detecting section in irradiating the optical flux having a short wavelength is compared with the output from the first light intensity detecting section in irradiating the optical flux having a long wavelength. A disappearance level near a point where the detected signal from the internal subject disappears is calculated. The first intensity of optical flux having a long wavelength is set to level higher than the disappearance level. Based on the output from the first light intensity detecting section obtained by the optical flux having a long wavelength of the first intensity, a subject inside the body to be detected is measured.
A surface inspection apparatus comprising:
A surface inspection method in which an optical flux having two types of wavelength, which are a short wavelength in the ultraviolet region and a long wavelength in the visible region, is made incident to a detected surface of a body to be detected, which is a subject of surface inspection at a predetermined incident angle and foreign particles are detected, the method including the steps of:
Dependencies are inferred from the claim text.