Photomask mounting/housing device and resist inspection method and resist inspection apparatus using same
AssigneeNEC Corporation
InventorsYoshikazu Katou, Takahiro Igeta, Hideyuki Moribe, Ryuji Hasegawa
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AssigneeNEC Corporation
InventorsYoshikazu Katou, Takahiro Igeta, Hideyuki Moribe, Ryuji Hasegawa
Estimating the term…
A resist inspection apparatus is provided which has a configuration in which a reticle is separated from a pellicle. A reticle cassette is made up of two pieces of plate members. A hollowed portion with a shape allowing the reticle to be inserted into the plate member. Another hollowed portion having a shape being slightly larger than that of the resist of the reticle is formed on the plate member. In the circumference of the hollowed portion is placed a pellicle frame on which a protective film is formed in a stretched manner. In the concave portion is housed in the reticle with a resist on the reticle directed toward the hollowed portion. The reticle is put in sealed space.
A photomask mounting/housing device for receiving and housing a photomask comprising:
A photomask mounting/housing device for receiving and housing a photomask comprising:
A resist inspection method for applying light to a photomask and inspecting a resist of said photomask by receiving reflected light from said photomask, comprising:
A resist inspection method for applying light to a photomask and inspecting a resist of said photomask by receiving reflected light from said photomask, comprising:
A resist inspection apparatus for applying light from an optical system to a photomask placed in a photomask placing portion and receiving reflected light from said photomask to perform inspection of a resist of said photomask, comprising:
A resist inspection apparatus for applying light from an optical system to a photomask placed in a photomask placing portion and receiving reflected light from said photomask to perform inspection of a resist of said photomask, comprising:
Dependencies are inferred from the claim text.