Dichroic beamsplitter for high energy laser diagnostics
AssigneeLawrence Livermore National Security, LLC
InventorsKai N LaFortune, Randall Hurd, Scott N Fochs, Mark D Rotter, Lloyd Hackel
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Abstract
Wavefront control techniques are provided for the alignment and performance optimization of optical devices. A Shack-Hartmann wavefront sensor can be used to measure the wavefront distortion and a control system generates feedback error signal to optics inside the device to correct the wavefront. The system can be calibrated with a low-average-power probe laser. An optical element is provided to couple the optical device to a diagnostic/control package in a way that optimizes both the output power of the optical device and the coupling of the probe light into the diagnostics.
Claims21
A system, comprising:
- an optical cavity resonant at a first wavelength;
- a probe laser for producing a probe beam at a second wavelength;
- a beam splitter (BS) and a deformable mirror located in said cavity, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating;
- an optical flat designed to reflect said second wavelength;
- and
- a wavefront sensor (WFS);
- wherein said probe beam is operatively positioned to be aligned for transmission through said BS and then to be reflected from said flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to said WFS, wherein a second portion of said beam will be reflected by said dichroic coating and make one complete oscillation through said cavity and then propagate to said WFS.
A method for aligning an optical cavity resonant at a first wavelength, comprising:
- locating a beam splitter (BS) and a deformable mirror in said cavity, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating;
- and
- aligning a probe beam for transmission through said BS, wherein said probe beam comprises a second wavelength, wherein after transmission of said probe beam through said BS, said probe beam will then be reflected from an optical flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to a wavefront sensor (WFS), wherein a second portion of said probe beam will be reflected by said dichroic coating and make one complete oscillation through said cavity and then propagate to said WFS.
An alignment system for aligning an optical system, wherein said optical system is capable of being aligned to have an optimum alignment at a first wavelength, wherein said optimum alignment is defined as a best alignment attainable under ambient conditions, wherein said alignment system comprises:
- a probe laser for producing a probe beam at a second wavelength;
- a beam splitter (BS) and a deformable mirror located in said optical system, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating;
- an optical flat designed to reflect said second wavelength;
- and
- a wavefront sensor (WFS);
- wherein said probe beam is positionable to be aligned for transmission through said BS and then to be reflected from said flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to said WFS, wherein a second portion of said beam will be reflected by said dichroic coating and will then propagate in said optical system and will then propagate to said WFS.
A method for aligning an optical system, wherein said optical system is capable of being aligned to have an optimum alignment at a first wavelength, wherein said optimum alignment is defined as a best alignment attainable under ambient conditions, wherein said method comprises:
- locating a beam splitter (BS) and a deformable mirror in said optical system, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating;
- and
- aligning a probe beam for transmission through said BS, wherein said probe beam comprises a second wavelength, wherein said probe beam will then be reflected from an optical flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to a wavefront sensor (WFS), wherein a second portion of said probe beam will be reflected by said dichroic coating and will propagate in said optical system and will then propagate to said WFS.
Dependencies are inferred from the claim text.