System and method for sensing geometric and photometric attributes of a scene with multiplexed illumination and solid states optical devices
AssigneeMitsubishi Electric Research Laboratories, Inc.
InventorsRamesh Raskar, Hideaki Nii, Jay W. Summet, Yong Zhao, Paul H. Dietz, Jonathan Westhues, Michael Noland, Erich Bruns, Shree Nayar, Vlad Branzoi
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