Method and system for monitoring the power state of an X-ray emitter and/or an X-ray detector
AssigneeSiemens Aktiengesellschaft
InventorsMathias Hörnig, Thomas Mertelmeier, Phillip Thaler
Life of this patent
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Abstract
In a method and system for monitoring the power state of an x-ray emitter and/or an x-ray detector, the x-ray emitter is operated according to a set of test parameters, so as to emit x-rays that strike at least a portion of the detector region of the x-ray detector. At least one value characterizing the operation of the x-ray emitter and/or the x-ray detector is determined, and this detected parameter is compared with a comparable reference parameter value. The power state of the x-ray emitter and/or the x-ray detector is determined based on deviation of the detected parameter from the reference parameter.
Claims26
A method for monitoring a power state of at least one of an x-ray radiator and an x-ray detector, said method comprising steps of:
- for an x-ray radiator, selecting a set of test parameters that define operation of said x-ray radiator;
- operating said x-ray radiator according to said test parameters to emit x-rays, and causing said x-rays to strike at least a portion of a detector region of an x-ray detector, and detecting said x-rays that strike said portion of said detector region of said x-ray detector;
- during emission of said x-rays and detection of said x-rays, detecting at least one parameter, as a detected parameter that characterizes an operational feature of at least one of said x-ray radiator and said x-ray detector;
- automatically comparing said detected parameter to a reference parameter that represents a reference value for said operational feature to identify a deviation between said detected parameter and said reference parameter;
- and
- dependent on a magnitude of said deviation, automatically identifying a power state of at least one of said x-ray radiator and said x-ray detector, and providing a humanly perceptible indication of said power state dependent on the identified power state.
A method for monitoring a power state of an x-ray detector, said method comprising steps of:
- for an x-ray detector, selecting at least one parameter that defines operation of said x-ray detector;
- operating said x-ray detector according to said at least one test parameter without detection of x-rays, detecting, with said x-ray detector, at least one parameter, as a detected parameter that characterizes an operational feature of said x-ray detector;
- automatically comparing said detected parameter to a reference parameter that represents a reference value for said operational feature to identify a deviation between said detected parameter and said reference parameter;
- and
- dependent on a magnitude of said deviation, automatically identifying a power state of said x-ray detector, and providing a humanly perceptible indication of said power state dependent on the identified power state.
A system for monitoring a power state of at least one of an x-ray radiator and an x-ray detector, said system comprising:
- an x-ray radiator;
- an x-ray detector;
- an input unit allowing selection of a set of test parameters that define operation of said x-ray radiator;
- a control unit connected to said input unit that operates said x-ray radiator according to said test parameters to emit x-rays, said x-rays striking at least a portion of a detector region of an x-ray detector, and said x-ray detector detecting said x-rays that strike said portion of said detector region of said x-ray detector;
- said x-ray detector, during emission of said x-rays and detection of said x-rays, detecting at least one parameter, as a detected parameter that characterizes an operational feature of at least one of said x-ray radiator and said x-ray detector;
- a monitoring unit supplied with said detected parameter that automatically compares said detected parameter to a reference parameter that represents a reference value for said operational feature to identify a deviation between said detected parameter and said reference parameter;
- and
- said monitoring unit being configured to automatically identify, dependent on a magnitude of said deviation, a power state of at least one of said x-ray radiator and said x-ray detector, and to provide a humanly perceptible indication of said power state dependent on the identified power state.
A system for monitoring a power state of an x-ray detector, said system comprising:
- an x-ray detector;
- an input unit allowing selection of a set of test parameters that define operation of said x-ray detector;
- a control unit connected to said input unit that operates said x-ray radiator according to said at least one test parameter without detection of x-rays, said x-ray detector detecting at least one parameter, as a detected parameter that characterizes an operational feature of at least one of said x-ray radiator and said x-ray detector;
- a monitoring unit supplied with said detected parameter that automatically compares said detected parameter to a reference parameter that represents a reference value for said operational feature to identify a deviation between said detected parameter and said reference parameter;
- and
- said monitoring unit being configured to automatically identify, dependent on a magnitude of said deviation, a power state and said x-ray detector, and to provide a humanly perceptible indication of said power state dependent on the identified power state.
Dependencies are inferred from the claim text.