Component test apparatus and component transport method
AssigneeSeiko Epson Corporation
InventorsMasakuni Shiozawa, Hiroaki Fujimori
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AssigneeSeiko Epson Corporation
InventorsMasakuni Shiozawa, Hiroaki Fujimori
Estimating the term…
A component test apparatus performing a test on an electronic component is disclosed. The component test apparatus includes a component loading device, a transport hand, and a component unloading device. A plurality of functional stations have mutually different functions and are spaced apart at equal intervals along a movement direction of the transport hand. The transport hand has a plurality of index units that are capable of holding the electronic component independently from one another and operating independently from one another. The index units are spaced apart at intervals equal to the intervals at which the functional stations are spaced apart along a transport direction of the electronic component from a loading position toward a test position.
A component test apparatus performing a test on an electronic component, the apparatus comprising:
A component transport method carried out by a component test apparatus that performs a test on an electronic component, the component test apparatus including a component loading device that loads the electronic component to a loading position, a transport hand capable of holding the electronic component so as to transport the electronic component from the loading position to a plurality of functional stations located at a test position, and to transport the tested electronic component from the functional stations to an unloading position, and a component unloading device that unloads the electronic component from the unloading position, the method comprising:
A component transport method carried out by a component test apparatus that performs a test on an electronic component, the component test apparatus including a component loading device that loads the electronic component to a loading position, two transport hands each capable of holding the electronic component so as to transport the electronic component from the loading position to a plurality of functional stations located at a test position, and to transport the tested electronic component from the functional stations to an unloading position, and a component unloading device that unloads the electronic component from the unloading position, the method comprising:
A component transport method carried out by a component test apparatus that performs a test on an electronic component, the component test apparatus including a component loading device that loads the electronic component to a loading position, a transport hand capable of holding the electronic component so as to transport the electronic component from the loading position to a plurality of functional stations located at a test position, and to transport the tested electronic component from the functional stations to an unloading position, and a component unloading device that unloads the electronic component from the unloading position, the method comprising:
Dependencies are inferred from the claim text.