Method and apparatus for measuring a lifetime of charge carriers

An apparatus for measuring a lifetime of charge carriers comprising:

• a measuring probe comprising means for directing ultraviolet radiation to a measuring position, said measuring probe further comprising at least one electrode provided at a predetermined spatial relationship to said measuring position, wherein said at least one electrode comprises a needle adapted to puncture said semiconductor structure or is adapted to provide an electrical connection to an electrically conductive contact structure formed on said semiconductor structure and wherein said measuring probe is adapted to maintain said predetermined spatial relationship between said at least one electrode and said measuring position;
• a microwave source adapted to direct microwave radiation to said measuring position;
• a microwave detector adapted to measure an alteration of an intensity of microwave radiation reflected at said measuring position in response to said ultraviolet radiation;
• a semiconductor structure holder adapted to receive a semiconductor structure and to provide an electric contact to a portion of said semiconductor structure;
• a means for moving said semiconductor structure holder relative to said measuring probe for positioning at least one portion of said semiconductor structure at said measuring position;
• and
• a power source adapted to apply a bias voltage between said semiconductor structure holder and said electrode.