Method and system for testing P2 stiffness of a magnetoresistance transducer at the wafer level
AssigneeWestern Digital (Fremont), LLC
InventorChanghe Shang
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Abstract
A method of testing P2 stiffness of a magnetoresistance (MR) sensor stack including a P2 pinned layer is provided. The method comprises the step of applying an external magnetic field to the MR sensor stack. The external magnetic field is oriented substantially perpendicular to a magnetic field of the P2 pinned layer. The method further comprises varying an amplitude of the external magnetic field, measuring a change in a resistance of the MR sensor stack in response to the varying amplitude of the external magnetic field, and calculating the P2 stiffness based on the measured change in resistance.
Claims15
A method of testing P2 stiffness of a magnetoresistance MR sensor stack including a P2 pinned layer, comprising the steps of:
- applying an external magnetic field to the MR sensor stack, the external magnetic field oriented substantially perpendicular to a magnetic field of the P2 pinned layer;
- varying an amplitude of the external magnetic field;
- measuring a change in a resistance of the MR sensor stack in response to the varying amplitude of the external magnetic field;
- and
- calculating the P2 stiffness based on the measured change in resistance.
Dependencies are inferred from the claim text.