Method for manufacturing photoelectric conversion device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHideto Ohnuma, Takashi Hirose
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHideto Ohnuma, Takashi Hirose
Estimating the term…
A fragile layer is formed in a single crystal silicon substrate, a first impurity silicon layer is formed on the one surface side in the single crystal silicon substrate, and a first electrode is formed thereover. After one surface of a supporting substrate and the first electrode are bonded, the single crystal silicon substrate is separated along the fragile layer to form a single crystal silicon layer over the supporting substrate. Crystal defect repair treatment or crystal defect elimination treatment of the single crystal silicon layer is performed; then, epitaxial growth is conducted on the single crystal silicon layer by activating a source gas containing at least a silane-based gas with plasma generated at atmospheric pressure or near atmospheric pressure. A second impurity silicon layer is formed on a surface side in the single crystal silicon layer which is epitaxial grown.
A method for manufacturing a photoelectric conversion device comprising:
A method for manufacturing a photoelectric conversion device comprising:
A method for manufacturing a photoelectric conversion device comprising:
A method for manufacturing a photoelectric conversion device comprising:
A method for manufacturing a photoelectric conversion device comprising:
A method for manufacturing a photoelectric conversion device comprising:
Dependencies are inferred from the claim text.