Surface coated cutting tool
AssigneeKYOCERA Corporation
InventorsHirotoshi Itoh, Takahito Tanibuchi
Life of this patent
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Abstract
A surface coated cutting tool having, on a surface of a substrate, a hard coating layer including at least an aluminum oxide layer, the surface having a rake face on a main face thereof and a flank on a side face thereof, wherein, when a value calculated by the following equation (I) is a texture coefficient TC of the (HKL) plane of the aluminum oxide layer, a ratio of a texture coefficient TCR on the rake face to a texture coefficient TCF on the flank, TCF/TCR, is in a range of 0.3 to 0.95. TC = I ( HKL ) / I O ( HKL ) 1 / 6 ∑ [ I ( hkl ) / I 0 ( hkl ) ] ( I ) where I(HKL), I0(HKL) and Σ[I(hkl)/I0(hkl)] are as described in the specification.
Claims28
A surface coated cutting tool having, on a surface of a substrate, a hard coating layer including at least an aluminium oxide layer, the surface having a rake face on a main face thereof and a flank on a side face thereof, wherein, when a value calculated by the following equation (I) is a texture coefficient TC of an (HKL) plane of the aluminium oxide layer, a ratio of a texture coefficient TCR on the rake face to a texture coefficient TCF on the flank, TCF/TCR, is in a range of 0.3 to 0.95
- TC
- =
- I
-
- (
- HKL
- )
- /
- I
- O
-
- (
- HKL
- )
- 1
- /
- 6
-
-
- ∑
- [
- I
-
- (
- hkl
- )
- /
- I
- 0
-
- (
- hkl
- )
- ]
- (
- I
- )
- where,
- (HKL) plane is one selected from (012), (104), (110), (113), (024), and (116) planes;
- I(HKL) is a measured value of an X-ray diffraction peak on the (HKL) plane;
- I0(HKL) is a standard X-ray diffraction peak on the (HKL) plane of a JCPDS card number 10-173;
- and
- Σ[I(hkl)/I0(hkl)] is a sum of values of [Measured value of X-ray diffraction peak]/[Standard X-ray diffraction peak] on the (012), (104), (110), (113), (024), and (116) planes.
Dependencies are inferred from the claim text.