Processing information management system in a plasma processing tool
AssigneeLam Research Corporation
InventorsChad R. Weetman, Chung-Ho Huang, Jacqueline Seto, John Jensen
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AssigneeLam Research Corporation
InventorsChad R. Weetman, Chung-Ho Huang, Jacqueline Seto, John Jensen
Estimating the term…
A plasma-processing tool for processing a substrate using at least a first process recipe and a second process recipe is provided. The plasma-processing tool includes transducers configured to collect process data streams, each process data stream pertaining to a process parameter being monitored during recipe execution. The tool also includes a logic circuitry configured for receiving a set of meta-data wherein each meta-data includes identification data about the substrate and the process recipe being executed. The logic circuitry is also configured for receiving a set of process data streams, each of which being associated with a specific process recipe. The logic circuitry further includes storing the meta-data and the process data streams associated with the first process recipe as a first file and the meta-data and the process data streams associated with the second process recipe as a second file.
An article of manufacture comprising a non-transitory program storage medium having computer readable code embodied therein, said computer readable code being configured for managing substrate processing data in a substrate processing environment, said substrate processing data being acquired while a substrate is processed in a plasma-processing chamber of a cluster tool, comprising:
A plasma-processing tool for processing at least a substrate using at least a first process recipe and a second process recipe, the plasma processing tool comprising:
A plasma processing information management system for managing substrate processing data acquired when a substrate is processed in a plasma-processing system, said plasma processing information management system comprising:
Dependencies are inferred from the claim text.