Device and method for generating variable slice reference level
AssigneeSamsung Electronics Co., Ltd.
InventorSang-min Hong
Life of this patent
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Abstract
A device and a method for generating a variable slice reference level. At least two variable slice reference levels used for slicing VBI data are generated. The device includes a high/low average value generator, a reference value detector, and a slice level generator. The high/low average value generator generates an average high value and an average low value of the VBI data using a plurality of window signals. The reference value detector generates an average reference value of the VBI data using the window signals. The slice level generator outputs a high slice level and a low slice level using the average high value, the average low value, the average reference value, and a tuned factor.
Claims29
A device for generating a variable slice reference level, the device comprising:
- an average high/low value generator generating an average high value and an average low value of VBI (vertical blanking interval) data using at least two window signals;
- a reference value detector generating an average reference value of the VBI data using the window signals;
- and
- a slice level generator generating a high slice level and a low slice level using the average high value, the average low value, the average reference value, and a tuned factor.
A method of generating at least two variable slice reference levels for slicing VBI (vertical blanking interval) data, the method comprising:
- setting at least two window intervals;
- detecting an average reference value, an average high value, and an average low value of the VBI data using the at least two window intervals;
- and
- generating a high slice level and a low slice level using the average reference value, the average high value, and the average low value.
Dependencies are inferred from the claim text.