Recovery processing method to be adopted in substrate processing apparatus, substrate processing apparatus and program
AssigneeTokyo Electron Limited
InventorNoriaki Shimizu
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AssigneeTokyo Electron Limited
InventorNoriaki Shimizu
Estimating the term…
The present invention provides a recovery processing method to restore the substrate processing apparatus to an operating state after correcting an abnormality having occurred in the substrate processing apparatus in operation and having resulted in a stop in the operation, comprising a substrate retrieval step in which substrate salvage processing is first executed for a wafer W left in a chamber in the substrate processing apparatus in correspondence to the extent to which the wafer has been processed at the time of the operation stop and the substrate having undergone the substrate salvage processing is then retrieved into the cassette storage container and an apparatus internal state restoration step in which the states inside the individual chambers of the substrate processing apparatus are restored.
A substrate processing apparatus that processes a processing target substrate, comprising:
A recovery processing method to be adopted in a substrate processing apparatus equipped with at least one processing chamber where a processing target substrate is processed to restore the substrate processing apparatus to an operating state after correcting an abnormality having occurred in the substrate processing apparatus in operation and having resulted in an operation stop, wherein substrate salvage processing is executed, the method comprising:
Dependencies are inferred from the claim text.